The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Oct. 31, 2008
Shih-chia Huang, Taipei, TW;
Sy-yen Kuo, Taipei, TW;
Shih-Chia Huang, Taipei, TW;
Sy-Yen Kuo, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
A spatial error concealment (SEC) method for concealing a spatial image error of an encoded image frame caused by a damaged macroblock (MB) is provided. The SEC method selects a proper SEC algorithm by adaptively classifying a plurality of correct MBs adjacent to the damaged MB, so as to execute interpolation pixel compensation or matching block copying, thus obtaining image data of the damaged MB. In such a way, the damaged MB is processed to apply the least affection to the entire image frame. The SEC algorithm is selected from bilinear interpolation (BI) method, directional interpolation (DI) method, multi-directional interpolation (MDI) method, and best neighborhood matching (BNM) method. The SEC method further includes a fast determination calculation, which utilizes image directional data related to the damaged MB in coding data of the original frame to execute a direct SEC process, for saving time on determination calculation, thus accelerating the processing speed.