The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Jun. 22, 2007
Surapong Lertrattanapanich, Irvine, CA (US);
Yeong Taeg Kim, Irvine, CA (US);
Surapong Lertrattanapanich, Irvine, CA (US);
Yeong Taeg Kim, Irvine, CA (US);
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
A method for detecting a pattern in an image includes defining a set of pixel values in an image using a window and calculating a Fourier transform of the pixel values. In one embodiment, the Fourier transform of the pixel values forms a spectrum. The method further comprises analyzing the spectrum of the Fourier transform to find a peak and analyzing the peak to determine whether the peak is indicative of the presence of a pattern in the image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile