The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Jan. 21, 2009
Applicants:

Daisuke Tanahashi, Hachioji, JP;

Yayoi Eguro, Hachioji, JP;

Inventors:

Daisuke Tanahashi, Hachioji, JP;

Yayoi Eguro, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning optical system is provided with a light source device (), a deflection optical system () that deflects the light flux from the light source device () to carry our a scan in a main-scanning direction (y), and a scanning and image-forming optical system () that forms the light flux deflected by the deflection optical system () into an image on a scanning surface (H). The scanning and image-forming optical system () includes at least a first lens (). The scanning optical system satisfies a predetermined condition relating to a numerical aperture of a light flux entering the deflection optical system () in a sub-scanning direction (z), and a distance between the deflection optical system () and the first lens (). The first lens () is a plastic lens made of a predetermined resin as a base material.


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