The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Aug. 20, 2008
Applicants:

Yongsoon Eun, Webster, NY (US);

R. Enrique Viturro, Rochester, NY (US);

Inventors:

Yongsoon Eun, Webster, NY (US);

R. Enrique Viturro, Rochester, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of measuring and correcting the Young's Modulus inline to eliminate its impact on image length variation during print runtime. The method includes intentionally perturbing the nominal operating condition of the web printing system which is controlled by the double reflex printing controller. The perturbation creates misregistration in a control target printed image that is detectable by in-situ sensors, from which Young's Modulus is estimated. Specifically, the web tension before the print zone is set differently from the web tension in the print zone to create misregistration. The error is detected by the inline sensors, and it is used to calculate the actual Young's Modulus. The implementation of the method consists of measuring the Young's Modulus at various frequencies. The correct Young's Modulus in then incorporated into the double reflex printing algorithm.


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