The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
May. 30, 2007
Hervé Rigneault, La Ciotat, FR;
Nicolas Sandeau, Plan de Cuques, FR;
Hugues Giovannini, Allauch, FR;
Hervé Rigneault, La Ciotat, FR;
Nicolas Sandeau, Plan de Cuques, FR;
Hugues Giovannini, Allauch, FR;
Centre National de la Recherche Scientifique—CNRS, Paris, FR;
Universite Paul Cezanne—Aix Marseille III, Aix-en-Provence, FR;
Abstract
The invention concerns a confocal microscope for imaging a sample comprising at least a light source, said microscope comprising at least an objective and a tube lens with an image focus, said microscope comprising interference means constructed to generate interference figures from said light source, characterized in that said interference means comprising first image generation means constructed to generate a first image of said light source, second image generation means constructed to generate a second image of said light source symmetrical to the first image relative to the image focus, image interference means constructed to make said first image and said second image interfere.