The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Jan. 26, 2007
Applicants:

Jing Gao, San Jose, CA (US);

B. Shane Giles, Fremont, CA (US);

Peter G. Webb, Menlo Park, CA (US);

Douglas N. Roberts, Campbell, CA (US);

Inventors:

Jing Gao, San Jose, CA (US);

B. Shane Giles, Fremont, CA (US);

Peter G. Webb, Menlo Park, CA (US);

Douglas N. Roberts, Campbell, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12M 1/34 (2006.01); G01N 33/48 (2006.01); C12N 15/11 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of selecting a set of normalization probes for use on a comparative genome hybridization array is provided. In certain embodiments, the method includes: a) selecting a first region of a genome to be evaluated by comparative genome hybridization to produce data; b) selecting a second region of the genome for normalization of the data, and c) selecting from a set of candidate probes a sub-set of normalization probes that detect the second region.


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