The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Aug. 05, 2004
Keiji Shioda, Hachioji, JP;
Kazuhito Nakanishi, Hachioji, JP;
Masakazu Mizoguchi, Tsukui-gun, JP;
Takashi Fukaya, Tama, JP;
Wataru Ohno, Hachioji, JP;
Masahiko Kinukawa, Sagamihara, JP;
Masaaki Ueda, Sagamihara, JP;
Motokazu Nakamura, Hino, JP;
Toru Shinmura, Hachioji, JP;
Kazuo Morita, Hachioji, JP;
Keiji Shioda, Hachioji, JP;
Kazuhito Nakanishi, Hachioji, JP;
Masakazu Mizoguchi, Tsukui-gun, JP;
Takashi Fukaya, Tama, JP;
Wataru Ohno, Hachioji, JP;
Masahiko Kinukawa, Sagamihara, JP;
Masaaki Ueda, Sagamihara, JP;
Motokazu Nakamura, Hino, JP;
Toru Shinmura, Hachioji, JP;
Kazuo Morita, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
There is disclosed an operation microscope in which an observing and displaying system of an operating instrument are selected, and an endoscope image for observing a dead angle of the microscope and a navigation image are selectively displayed in a microscope observation field, so that a tomographic image, three-dimensionally constructed image, and the like can be selectively displayed in a display screen in accordance with a treatment position displayed in a monitor or an observation position of the operation microscope.