The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2012

Filed:

Mar. 16, 2011
Applicants:

Masaaki Hanebuchi, Aichi, JP;

Yasuhiro Furuuchi, Aichi, JP;

Norimasa Satake, Aichi, JP;

Inventors:

Masaaki Hanebuchi, Aichi, JP;

Yasuhiro Furuuchi, Aichi, JP;

Norimasa Satake, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for generating a two-dimensional image of an object using an optical coherence tomography (OCT) optical system, includes: the OCT optical system including: a light source; a splitter for splitting light emitted from the light source into a measurement optical path and a reference optical path; a scanner arranged in the measurement optical path for scanning the object in at least one of XY directions with the split light; and a detector for detecting a spectrum of combined light of the split light from the measurement optical path reflected on the object and the split light from the reference optical path each XY position of the light on the object, and a processor for generating the two-dimensional image of the object in the XY directions by converting the number of zero cross points of an interference signal contained in the spectrum at each XY position into a luminance value.


Find Patent Forward Citations

Loading…