The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Sep. 05, 2007
Pierre-yves David, Jouy le Moutier, FR;
Bruno Le Briere, Paris, FR;
Arlette Fourrier-lamer, Les Lilas, FR;
Olivier Dubrunfaut, Palaiseau, FR;
Jean-claude Badot, Paris, FR;
Emmanuel Bondet DE LA Bernardie, Toulon, FR;
Pierre-Yves David, Jouy le Moutier, FR;
Bruno Le Briere, Paris, FR;
Arlette Fourrier-Lamer, Les Lilas, FR;
Olivier Dubrunfaut, Palaiseau, FR;
Jean-Claude Badot, Paris, FR;
Emmanuel Bondet De La Bernardie, Toulon, FR;
Geoservices Equipements, Roissy en France, FR;
Centre National de la Recherche Scientifique (C.N.R.S.), Paris, FR;
Ecole Superieure d'Electricite (Supelec), Cedex, FR;
Abstract
A method and device includes measuring a multiple-phase fluid flowing through a pipe. The inventive method includes the following steps in which: a fluid is illuminated using a first coaxial probe placed in contact with the liquid phase of the fluid, and a first electromagnetic wave is emitted at a high frequency. The admittance at the interface between the first probe and the fluid is measured, and the fractions of at least two constituents of the liquid phase are calculated in order to obtain the effective permittivity (∈) of the phase. The method also includes the following steps in which: the fluid is illuminated using a second coaxial probe and a second electromagnetic wave is emitted at a low frequency. The admittance at the interface between the second probe and the liquid is measured, and the thickness (e) of the liquid is measured. The aforementioned calculation is performed on the basis of the calculated effective permittivity (∈) and the admittance measured by the second probe.