The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Jan. 18, 2009
Palkesh Jain, Bangalore, IN;
Young-joon Park, Plano, TX (US);
Srikanth Krishnan, Richardson, TX (US);
Guru Chakrapani Prasad, Bangalore, IN;
Palkesh Jain, Bangalore, IN;
Young-Joon Park, Plano, TX (US);
Srikanth Krishnan, Richardson, TX (US);
Guru Chakrapani Prasad, Bangalore, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Apportioning unequally contributions of different metal paths of a circuit to electromigration (EM) reliability. In an embodiment, a corresponding parameter value representing a magnitude of excess current flowing in a single direction in each metal path is determined. A desired reliability measure for electromigration (EM) is apportioned among the metal paths based on computed parameter values for the corresponding metal path. A reliability analysis for the circuit is performed based on the apportioning. In an embodiment, metal paths which predominantly carry currents with an average value less than a threshold are excluded from being considered as contributors to EM degradation.