The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

May. 13, 2009
Applicants:

Prasan Roy, Foster City, CA (US);

Eric Friedman, Mountain View, CA (US);

Peter Pawlowski, Menlo Park, CA (US);

Rangarajan Vasudevan, Belmont, CA (US);

Inventors:

Prasan Roy, Foster City, CA (US);

Eric Friedman, Mountain View, CA (US);

Peter Pawlowski, Menlo Park, CA (US);

Rangarajan Vasudevan, Belmont, CA (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Several methods and a system for analyzing ordered data using pattern matching over an indefinitely long ordered sequence of rows in a relational database are disclosed. In one embodiment, a method of a server includes receiving an ordered data in a relational database. The method further includes matching a pattern specified in a query on ordered data in a relational database in a single pass in constant space for overlapping mode of results. The method also includes creating an output data in the single pass in constant space for overlapping mode of results based on the matching of the ordered data with the pattern in the relational database query.


Find Patent Forward Citations

Loading…