The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Oct. 29, 2008
Wang-ding Su, Taipei Hsien, TW;
Yung-cheng Hung, Taipei Hsien, TW;
Hsien-chuan Liang, Taipei Hsien, TW;
Po-kai Huang, Taipei Hsien, TW;
Mi-wen Tsai, Taipei Hsien, TW;
Chi-ren Kuo, Taipei Hsien, TW;
Wang-Ding Su, Taipei Hsien, TW;
Yung-Cheng Hung, Taipei Hsien, TW;
Hsien-Chuan Liang, Taipei Hsien, TW;
Po-Kai Huang, Taipei Hsien, TW;
Mi-Wen Tsai, Taipei Hsien, TW;
Chi-Ren Kuo, Taipei Hsien, TW;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A testing system for bus parameters includes a wave displaying unit and a control module connected to the wave displaying unit. The control module includes a decode unit, a testing unit connected to the decode unit, and an output unit connected to the testing unit. The decode unit is connected to the wave displaying unit. The wave displaying unit is configured for receiving an electronic signal from a bus to be tested. The decode unit is configured for decoding the electronic signal to determine if the electronic signal is valid. The testing unit tests parameters of the bus. The output unit displays testing results for the parameters.