The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Oct. 16, 2009
Ronald T. Kurnik, Foster City, CA (US);
Ronald T. Kurnik, Foster City, CA (US);
Roche Molecular Systems, Inc., Pleasanton, CA (US);
Abstract
Numerical determinations of the first derivatives of a melt curve data set are made. A baseline is determined for the first derivative values and the baseline is subtracted from the first derivative values to produce modified first derivative values. A first maximum value of the modified first derivative values is determined and said first maximum value represents a melting temperature Tm of a DNA sample. A model function, such as a Gaussian Mixture Model (GMM) function, with parameters determined using a Levenberg-Marquardt (LM) regression process can also be used to find an approximation to the first derivative curve. The maximum values of the numerically determined first derivative values are used as initial conditions for parameters of the model function. The determined parameters provide one or more fractional melting temperature values, which can be returned, for example, displayed or otherwise used for further processing.