The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Sep. 12, 2008
Ronald T. Kurnik, Foster City, CA (US);
Martin Titz, Rotkreuz, CH;
Ronald T. Kurnik, Foster City, CA (US);
Martin Titz, Rotkreuz, CH;
Roche Molecular Systems, Inc., Pleasanton, CA (US);
Abstract
Systems and methods for determining a transition value in a sigmoid or growth curve, such as the end of the baseline region or the elbow value or Ct value of a PCR amplification curve. Numerical determinations of the second derivatives and curvature values of a PCR data set are made. A Gaussian Mixture Model (GMM) function with parameters determined using a Levenberg-Marquardt (LM), or other, regression process is used to find an approximation to the second derivative values and to the curvature values, where the maximum values of the numerically determined second derivative values and/or curvature values are used as initial conditions for parameters of the GMM function. The determined parameters provide fractional Ct values. The Ct value(s) are then returned and may be displayed or otherwise used for further processing.