The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Sep. 14, 2009
Tetsuichi Satonaga, Ashigarakami-gun, JP;
Masayasu Takano, Ebina, JP;
Noriyuki Matsuda, Ebina, JP;
Akiko Seta, Ebina, JP;
Koji Adachi, Ashigarakami-gun, JP;
Kaoru Yasukawa, Ashigarakami-gun, JP;
Tetsuichi Satonaga, Ashigarakami-gun, JP;
Masayasu Takano, Ebina, JP;
Noriyuki Matsuda, Ebina, JP;
Akiko Seta, Ebina, JP;
Koji Adachi, Ashigarakami-gun, JP;
Kaoru Yasukawa, Ashigarakami-gun, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
A quality control method includes: extracting, from a time series distribution of troubles that have occurred in electronic equipments, a first characteristics of states of occurrence of the troubles; specifying one or more parts included in the electronic equipments, the parts being involved with the troubles; extracting, from another time series distribution of a rate of use corresponding to each of suppliers which supply the specified parts, a second characteristics of the parts; and specifying one or more of the suppliers supplying the parts correlated to the troubles based on a correlation between the extracted first characteristics and the extracted second characteristics.