The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

Aug. 20, 2008
Applicant:

IL Dong Yun, Seongnam-si, KR;

Inventor:

Il Dong Yun, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for evaluating image registration is provided. The apparatus includes a graph generation unit configured to generate a graph based on a plurality of registered images and a plurality of transformation rules therebetween, the graph comprising a plurality of nodes respectively corresponding to the registered images and a plurality of edges respectively corresponding to at least part of the transformation rules; a general transition unit configured to identify one or more loops for at least one of the nodes within the graph and to transform the registered image corresponding to the at least one node along the one or more identified loops to provide one or more transformed images; and a general transition error unit configured to produce a similarity measure between the registered image corresponding to the at least one node and at least one of the transformed images, wherein the graphic generation unit is further configured to calculate an inverse consistency metric for at least one pair of the registered images and a pair of transformations rules between the at least one registered image pair, and to establish as the edges the pair of transformation rules with an inverse consistency metric within a prescribed range.


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