The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

Dec. 23, 2008
Applicants:

Jakob Raundahl, Kokkedal, DK;

Marco Loog, Rotterdam, NL;

Mads Nielsen, Dragør, DK;

Inventors:

Jakob Raundahl, Kokkedal, DK;

Marco Loog, Rotterdam, NL;

Mads Nielsen, Dragør, DK;

Assignee:

Synarc Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of processing a mammogram image to derive a value for a parameter useful in detecting differences in breast tissue in subsequent images of the same breast or relative to a control group of such images, said derived parameter being an aggregate probability score reflecting the probability of the image being a member of a predefined class of mammogram images, comprises computing for each of a multitude of pixels within a large region of interest within the image a pixel probability score assigned by a trained statistical classifier according to the probability of said pixel belonging to an image belonging to said class, said pixel probability being calculated on the basis of a selected plurality of features of said pixels, and computing said parameter by aggregating the pixel probability scores over said region of interest. Said features may include the 3-jet of said pixels.


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