The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

Nov. 02, 2007
Applicants:

Lutz Müller, Nürnberg, DE;

Caterina Brusasco, Bossiere, BE;

Björn Hårdemark, Stockholm, SE;

Johan Löf, Djursholm, SE;

Anders Murman, Uppsala, SE;

Inventors:

Lutz Müller, Nürnberg, DE;

Caterina Brusasco, Bossiere, BE;

Björn Hårdemark, Stockholm, SE;

Johan Löf, Djursholm, SE;

Anders Murman, Uppsala, SE;

Assignees:

Ion Beam Applications S.A., Louvain-la-Neuve, unknown;

Raysearch Laboratories AB, Stockholm, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided for monitoring and/or signalling errors of a radiation therapy apparatus during delivery of a radiation treatment to a target, the radiation therapy apparatus being configurable for a given radiation treatment by means of a beam shaping device. The method includes providing a radiation array detector between the beam shaping device and the target, capable of providing a measured detector response of the radiation treatment; determining a predicted detector response for successive times of the radiation treatment; measuring the measured detector response caused by the radiation beams for corresponding successive times of the radiation treatment; performing a comparison between the measured detector response and the corresponding predicted detector response; signalling in a short reaction time, an error when the comparison results in a difference which exceeds a given threshold. The disclosure also relates to a device comprising electronic 2-dimensional detectors, processor device and a main software.


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