The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Mar. 30, 2009
Sean Campeau, Kanata, CA;
Sean Campeau, Kanata, CA;
Applied Micro Circuits Corporation, San Diego, CA (US);
Abstract
A system and method are provided for using disparity measurements to control the adjustment of a data slicer threshold. The method receives a serial stream of pseudorandom digital data signals having an average DC value, and compares data signal amplitudes to a slicer threshold value. In response to the slicer threshold value comparison, data signal '1' and '0' values are determined. A first sum of determined “1” values is created, and a second sum of determined “0” values is created. The slicer threshold value is adjusted in response to the comparison of the first and second sums. More explicitly, the slicer threshold value is adjusted to make “1” values more likely in response to the second sum being larger than the first sum. Alternately, the slicer threshold value is adjusted to make “0” values more likely in response to the second sum being smaller than the first sum.