The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Feb. 19, 2009
Haw Chong Soon, Widnau, CH;
Manfred Kuster, Widnau, CH;
Haw Chong Soon, Widnau, CH;
Manfred Kuster, Widnau, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
An illumination device for a microscope has a variable working distance (d, d'), at which an object is illuminated obliquely from two different directions. Light from a light source is split into at least two illumination beam paths. In order to adapt to the different working distances, the light is subjected to an angle change before splitting or, if after splitting, then respectively by the same amount in both beam paths. A deviating element with at least two reflective surfaces is arranged in one of the illumination beam paths to induce a change in an angle at which one of the illumination beam paths strikes the object, in the same sense as another illumination beam path. The reflective surfaces may be arranged so that the illumination beam paths strike essentially the same region of the optical axis even with different working distances.