The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Sep. 02, 2009
Applicant:
Hiroyuki Kimura, Sendai, JP;
Inventor:
Hiroyuki Kimura, Sendai, JP;
Assignee:
Freescale Semiconductor, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test controller switches the operation of output stages in an integrated circuit between a normal operation mode and a test mode. The output stages are respectively connected to switch elements. A level shifter generates a switch signal for controlling activation and deactivation of the switch elements in accordance with the normal operation mode and the test mode.
Kimura, Hiroyuki. (2012). Method and circuit for testing integrated circuit (U.S. Patent No. 8217673). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8217673
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile