The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

Dec. 18, 2007
Applicants:

Wendy Uyen Dittmer, Eindhoven, NL;

Peggy DE Kievit, Eindhoven, NL;

Jeroen Hans Nieuwenhuis, Eindhoven, NL;

Menno Willem Jose Prins, Eindhoven, NL;

Leonardus Josephus Van Ijzendoorn, Eindhoven, NL;

Xander Jozef Antoine Janssen, Neerpelt, BE;

Inventors:

Wendy Uyen Dittmer, Eindhoven, NL;

Peggy De Kievit, Eindhoven, NL;

Jeroen Hans Nieuwenhuis, Eindhoven, NL;

Menno Willem Jose Prins, Eindhoven, NL;

Leonardus Josephus Van Ijzendoorn, Eindhoven, NL;

Xander Jozef Antoine Janssen, Neerpelt, BE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for measuring agglutination in a target-induced agglutination assay with one or more magnetic particles is performed in a reaction chamber. After the magnetic particles, which are capable of binding to a target are provided in the assay, an agglutination process is performed resulting in agglutinated particles. Further an alternating current magnetic field (H) is applied to the assay. The method further includes measuring an effect of the Hon the one or more magnetic particles unattached to any surface. The measured effect is indicative of one or more agglutination parameters.


Find Patent Forward Citations

Loading…