The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Oct. 17, 2008
Applicant:
Thomas Karpen, Skaneateles, NY (US);
Inventor:
Thomas Karpen, Skaneateles, NY (US);
Assignee:
GE Inspection Technologies, LP, Lewistown, PA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspection apparatus is provided that can include at least one probe receiving unit. The at least one probe receiving unit can be capable of processing data corresponding to one or more of image information of the type that can be generated by a visual inspection probe, eddy current information of the type that can be generated by a eddy current probe, and ultrasound information of the type that can be generated by a ultrasound probe.