The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Dec. 14, 2009
James Zhengshe Liu, Glenview, IL (US);
Feng Gao, Naperville, IL (US);
Kenneth Scott Kump, Waukesha, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Feng Gao, Naperville, IL (US);
Kenneth Scott Kump, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system and method for eliminating image artifacts caused by electromagnetic interference (EMI) on a digital x-ray detector. The system and method includes a digital x-ray detector panel having an array of pixels in rows and columns, with a plurality of data lines coupled to the columns of pixels and a plurality of scan lines coupled to the rows of pixels. The system and method uses certain photodiodes in a row of the pixel array for measuring EMI with corresponding scan line and FETs deactivated and eliminating the EMI and image artifacts with the remaining photodiodes in the row with corresponding scan line and FETs activated.