The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Jun. 03, 2009
Yoshimasa Kawata, Hamamatsu, JP;
Atsuo Miyakawa, Hamamatsu, JP;
Yoshimasa Kawata, Hamamatsu, JP;
Atsuo Miyakawa, Hamamatsu, JP;
National University Corporation Shizuoka University, Shizuoka-shi, JP;
Abstract
An optical microscope for optically measuring a sample () includes: a fluorescent thin membrane () which at least partly contains fluorescent substance and on which the sample () is placed; an electron source () for generating an electron beam; an electron lens () for focusing the electron beam generated by the electron source () in such a manner as to excite a minute light source having a wavelength shorter than a visible light wavelength from the fluorescent thin membrane () so as to irradiate the fluorescent thin membrane () with the electron beam, and further, scanning the focused electron beam; and an optical detector () for detecting a measurement light beam which is generated in the minute light source and acts on the sample ().