The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Mar. 17, 2008
Akira Hamanaka, Tokyo, JP;
Takashi Daimaru, Tokyo, JP;
Ryo Terai, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Abstract
A lens holder () is attached to a processing target lens () such that a holder center (O) coincides with a processing center position () of the lens. An axial deviation measuring mark () is displayed on the processing target lens () to coincide with a reference position mark () of the lens holder (), and the circumferential surface of the processing target lens () undergoes primary processing. After primary processing, the axial deviation of the processing target lens () is measured from the reference position mark () and axial deviation measuring mark (). When axial deviation exists, the lens holder () is removed from the processing target lens () and the processing target lens () is held again, so that the axial deviation is corrected. After that, the processing target lens () undergoes secondary processing.