The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Jul. 12, 2010
Kazushi Takei, Tokyo, JP;
Hiroshi Takahashi, Kanagawa, JP;
Masato Kobayashi, Kanagawa, JP;
Tomonori Kimura, Kanagawa, JP;
Yuichi Sakurada, Kanagawa, JP;
Arata Suzuki, Kanagawa, JP;
Nobuyuki Satoh, Kanagawa, JP;
Yasuo Sakurai, Kanagawa, JP;
Kazushi Takei, Tokyo, JP;
Hiroshi Takahashi, Kanagawa, JP;
Masato Kobayashi, Kanagawa, JP;
Tomonori Kimura, Kanagawa, JP;
Yuichi Sakurada, Kanagawa, JP;
Arata Suzuki, Kanagawa, JP;
Nobuyuki Satoh, Kanagawa, JP;
Yasuo Sakurai, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
A recording apparatus includes a carriage; a first head group including a recording head and disposed on the carriage; and a second head group including a recording head and disposed on the carriage adjacent the first head group in a staggered manner with respect to a sub-scan direction. The carriage is configured to move in a main scan direction in order to record an image on a recording medium. The recording apparatus further includes a forming unit configured to form plural test patterns including a first pattern formed by the recording head of the first head group and a second pattern formed by the recording head of the second head group. The test patterns are spaced apart from one another in the sub-scan direction. The position of the second pattern relative to the first pattern in the sub-scan direction is varied successively from one test pattern to another.