The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Jul. 16, 2008
Applicants:
Silvia Bellucci, Rome, IT;
Bruno Portaluri, Rome, IT;
Inventors:
Silvia Bellucci, Rome, IT;
Bruno Portaluri, Rome, IT;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
Mechanisms for Orthogonal Defect Classification (ODC) analysis in a computing system are provided. One implementation involves determining a defect in a software application, providing a defect fix to the software application, linking the source code fix to the defect, and automatically performing ODC analysis and calculating ODC information based on calculations against the source code linked to the defect fixed.
Bellucci, Silvia. (2012). Automatic calculation of orthogonal defect classification (odc) fields (U.S. Patent No. 8214798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8214798
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile