The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Mar. 12, 2009
Applicants:

Paul E. Mckechnie, Midlothian, GB;

Nathan A. Lindop, Musselburgh, GB;

Inventors:

Paul E. McKechnie, Midlothian, GB;

Nathan A. Lindop, Musselburgh, GB;

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for monitoring a device under test implemented within an integrated circuit (IC) can include at least one probe that detects a designated type of data transaction, where in response to detecting the designated type of data transaction, each probe outputs a single data transaction detection signal. The system also can include a data collector coupled to each probe, where the data collector stores an indication of each data transaction detection signal that is output by each probe. The data collector can be configured so that no value of any probed signal is stored.


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