The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Feb. 22, 2010
Renbin Peng, Syracuse, NY (US);
Hao Chen, Syracuse, NY (US);
Pramod K. Varshney, Fayetteville, NY (US);
Renbin Peng, Syracuse, NY (US);
Hao Chen, Syracuse, NY (US);
Pramod K. Varshney, Fayetteville, NY (US);
Syracuse University, Syracuse, NY (US);
Abstract
Apparatus and method for detecting micro-calcifications in mammograms using novel algorithms and stochastic resonance noise is provided, where a suitable dose of noise is added to the abnormal mammograms such that the performance of a suboptimal lesion detector is improved without altering the detector's parameters. A stochastic resonance noise-based detection approach is presented to improve suboptimal detectors which suffer from model mismatch due to the Gaussian assumption. Furthermore, a stochastic resonance noise-based detection enhancement framework is presented to deal with more general model mismatch cases.