The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Dec. 03, 2009
Jianzhong Zhang, Brea, CA (US);
Arkadij M. Elizarov, Woodland Hills, CA (US);
Reza Miraghaie, Culver City, CA (US);
Carroll Edward Ball, Los Angeles, CA (US);
Hartmuth C. Kolb, Playa Del Rey, CA (US);
Jianzhong Zhang, Brea, CA (US);
Arkadij M. Elizarov, Woodland Hills, CA (US);
Reza Miraghaie, Culver City, CA (US);
Carroll Edward Ball, Los Angeles, CA (US);
Hartmuth C. Kolb, Playa Del Rey, CA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Methods and apparatus to assess current aspects of Quality Control useful for release of radioactive compounds for imaging, such as PET tracers as injectables, in an automated manner, without user interference, and in compliance with regulatory guidelines. The present method and system relates to an integrated automated quality control analysis of a substance utilizing a single sample injection for a plurality of inline quality control tests. A quantitative analysis of the sample via the plurality of quality control tests is conducted. A measurement value of each of the plurality of quality control parameters is determined and a comparison of each measurement value of the plurality of quality control parameters with a predetermined corresponding criterion value is made. A cumulative quality rating for the sample is determined and the validated sample is released based on the quality rating.