The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Mar. 20, 2009
Applicants:

Alexander C. Loui, Penfield, NY (US);

Wei Jiang, New York, NY (US);

Inventors:

Alexander C. Loui, Penfield, NY (US);

Wei Jiang, New York, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for facilitating semantic event classification of a group of image records related to an event. The method using an event detector system for providing: extracting a plurality of visual features from each of the image records; wherein the visual features include segmenting an image record into a number of regions, in which the visual features are extracted; generating a plurality of concept scores for each of the image records using the visual features, wherein each concept score corresponds to a visual concept and each concept score is indicative of a probability that the image record includes the visual concept; generating a feature vector corresponding to the event based on the concept scores of the image records; and supplying the feature vector to an event classifier that identifies at least one semantic event classifier that corresponds to the event.


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