The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Mar. 29, 2010
Chin H. Toh, Orange, CA (US);
Maurice Peter Bianchi, Palos Verdes Estates, CA (US);
Chin H. Toh, Orange, CA (US);
Maurice Peter Bianchi, Palos Verdes Estates, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Methods and systems for X-ray imaging enable inspection of an area of an object that is located separate and apart from a location of an X-ray generator. An X-ray imaging system includes an X-ray generator to generate X-rays. A collimator filters the generated X-rays to consolidate the generated X-rays and move the generated X-rays in a direction parallel to a centerline axis of the collimator. A small diameter tube transmits the directed X-rays and an end retainer emits the transmitted X-rays at an inspection object. A first filter of the collimator may initially filter the generated X-rays that are not parallel to the centerline axis of the collimator by passing the X-rays through a plurality of apertures. A second filter of the collimator may consolidate the generated X-rays and move the generated X-rays in a direction parallel to the centerline axis of the collimator by passing the generated X-rays through a channel.