The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Sep. 22, 2010
Frank Dennerlein, Forchheim, DE;
Holger Scherl, Erlangen, DE;
Frank Dennerlein, Forchheim, DE;
Holger Scherl, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for determining attenuation coefficients for an object using a movable x-ray source and a detector for recording projections is provided. The method includes defining a trajectory for the movable x-ray source, defining filtering lines for the filtering of projection data, and defining positions on the filtering lines, at which the projection derivative is to be formed using a mathematical algorithm for a back-projection. The method also includes defining sampling positions on the trajectory, traversing, by the x-ray source, the trajectory and recording a projection for each sampling position. Projection derivatives with respect to the trajectory path are calculated numerically for each of the positions directly on the filtering lines, and using a mathematical algorithm, attenuation coefficients are determined for the object from the calculated projection derivatives, for the reconstruction.