The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Jun. 19, 2008
Applicant:

Naoki Suehiro, Tsukuba, JP;

Inventor:

Naoki Suehiro, Tsukuba, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A parallel sampling device includes a memory that stores the values of the sampling function (Sin πt/πt), a low pass filter, a sampler that samples a signal, which has passed through low pass filter, at a sampling period of Ts, and a parallel sampler provided in a stage following the sampler. The parallel sampler generates parallel sampled values at an interval of the sampling period Ts/N (N is a natural number equal to or larger than 2) based on sampled values obtained by the sampler and the values of the sampling function stored in the memory. This configuration allows parallel sampling to be performed easily even if the frequency is high or the sampling period of parallel sampling is narrow.


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