The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Apr. 04, 2008
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Christopher Power, Jena, DE;
Helmut Lippert, Jena, DE;
Benno Radt, Jena, DE;
Christian Dietrich, Jena, DE;
Christopher Power, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
The invention relates to an objective replacement device for a microscope, wherein the sample is located in a sample chamber and surrounded by an immersion medium within the sample chamber, means for positioning and aligning the sample relative to the focus of an objective being present, wherein the detection beam path is aligned horizontally, which is to say perpendicular to the direction of action of gravity. For an objective replacement device for a microscope of the type described above, according to the invention a device is provided for exchanging the objective, at the focus of which the sample is positioned and aligned, with at least another objective, the position and alignment of the sample within the sample chamber remaining the same.