The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Mar. 27, 2008
Michael L. Myrick, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
David L. Perkins, Irmo, SC (US);
Terrell Teague, Macedon, NY (US);
William Soltmann, Columbia, SC (US);
Leonard Zheleznyak, Pittsford, NY (US);
Michael L. Myrick, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
David L. Perkins, Irmo, SC (US);
Terrell Teague, Macedon, NY (US);
William Soltmann, Columbia, SC (US);
Leonard Zheleznyak, Pittsford, NY (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward a plurality of optical detectors. Signals from the detectors are compared with a reference signal based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.