The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Mar. 23, 2009
Masayuki Naya, Ashigara-kami-gun, JP;
Yuichi Tomaru, Ashigara-kami-gun, JP;
Naoki Murakami, Ashigara-kami-gun, JP;
Masayuki Naya, Ashigara-kami-gun, JP;
Yuichi Tomaru, Ashigara-kami-gun, JP;
Naoki Murakami, Ashigara-kami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A method of measuring Raman signals comprises: an analyte placing step of placing an analyte on a detection surface of a microstructure plate which generates an enhanced electric field when irradiated with excitation light; an irradiating step of irradiating the detection surface with the excitation light so that the enhanced electric field is generated around the detection surface and light is emitted from the analyte and the detection surface to be enhanced by the generated enhanced electric field; a Raman signal obtaining step of detecting the enhanced light to obtain a Raman signal emitted from the analyte and a background signal for use as a reference, the Raman signal and the background signal having respective intensities; and a normalizing step of normalizing the Raman signal from the analyte by dividing the intensity of the Raman signal from the analyte by the intensity of the background signal obtained as the reference.