The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Dec. 18, 2009
John D. Tomisek, Lombard, IL (US);
Robert W. Jaekel, Deer Park, IL (US);
Ronald E. Kukla, Wheeling, IL (US);
Russell L. Sage, McHenry, IL (US);
Shahin Iqbal, Rochester Hills, MI (US);
John D. Tomisek, Lombard, IL (US);
Robert W. Jaekel, Deer Park, IL (US);
Ronald E. Kukla, Wheeling, IL (US);
Russell L. Sage, McHenry, IL (US);
Shahin Iqbal, Rochester Hills, MI (US);
Abbott Laboratories, Des Plaines, IL (US);
Abstract
A method and apparatus of the present invention determines whether zero, one, or a plurality of microscope slide coverslips are about to be applied to a microscope slide. Light, such as ultraviolet light, may be directed toward a coverslip testing region, in which a number of coverslips reside. The amount of light passing through the coverslip testing region is collected and measured. Based on the measured amount, the method and apparatus determine the number of coverslips present in the coverslip testing region.