The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Jul. 23, 2008
Applicants:
Matthia Prams, Raubling, DE;
Michael Gandyra, Rosenheim, DE;
Roman Apanovich, Kolbermoor, DE;
Inventors:
Assignee:
Steinbichler Optotechnik GmbH, Neubeuern, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An improved method for surveying actual measurement data of a component, which originate from an optical scan, is characterized in that the actual measurement data () of the component () are surveyed by means of a measurement program () for a tactile coordinate measuring instrument, wherein the measurement program () generates a virtual measuring stylus of a virtual coordinate measuring instrument, which surveys the actual measurement data of the component.