The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Nov. 03, 2009
Applicants:

Norikazu Tonogai, Ayabe, JP;

Yutaka Kato, Fukuchiyama, JP;

Kiyoshi Imai, Kyoto, JP;

Inventors:

Norikazu Tonogai, Ayabe, JP;

Yutaka Kato, Fukuchiyama, JP;

Kiyoshi Imai, Kyoto, JP;

Assignee:

Omron Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides an image processing device capable of appropriately generating a synthetic image with an enlarged dynamic range even when a measuring article is moving. A work to be a reference (reference work) is imaged a plurality of times under an exposure condition same as that for generating a synthesized image, and specified regions are registered as reference images from a plurality of input images acquired in the respective imaging processes. In an operation mode, a plurality of input images is acquired by imaging a work a plurality of times under a plurality of exposure conditions, and search processes based on the reference images are executed on the respective input images. A partial image having a predetermined size is extracted from each of the plurality of input images based on each specified position, and an image synthesizing process is executed on the plurality of extracted partial images to generate a synthesized image.


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