The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Dec. 06, 2007
Applicant:

Kouji Fujiyoshi, Tokyo, JP;

Inventor:

Kouji Fujiyoshi, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); G01J 1/20 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

This is a microscope image pickup apparatus for shooting and forming the observation images of a specimen in order to observe it by a microscope. The microscope image pickup apparatus comprises an image pickup unit for shooting and forming the observation images, a display unit for dynamically displaying the observation images shot and formed by the image pickup unit in succession and an operating state detection unit for detecting an operating state of a microscope operation part in order to operate the microscope on the basis of the change of the observation images dynamically displayed on the display unit. The present invention provides a microscope image pickup apparatus, a microscope image pickup program product, a microscope image pickup program transmission medium and a microscope image pickup method which are capable of displaying an optimum moving image according to the operating state of the microscope.


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