The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2012
Filed:
Mar. 27, 2008
David L. Perkins, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John C. Blackburn, Charleston, SC (US);
Jonathan H. James, Columbia, SC (US);
David L. Perkins, Irmo, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John C. Blackburn, Charleston, SC (US);
Jonathan H. James, Columbia, SC (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.