The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Mar. 16, 2010
Applicants:

Alexandre Carella, Mazeres Lezons, FR;

Jean-pierre Simonato, Sassenage, FR;

Inventors:

Alexandre Carella, Mazeres Lezons, FR;

Jean-Pierre Simonato, Sassenage, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/20 (2006.01); G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an apparatus and to a method for detecting and/or quantifying mercuric ions, Hg. The apparatus of the invention is of the type comprising an electrical device comprising two electrodes and a substrate comprising at least one surface made of an organic or inorganic semiconductor material, the electrodes being in electrical contact with said organic or inorganic semiconductor material, and a device for measuring the variation in the conduction current between the two electrodes, and wherein at least one compound which complexes mercuric ions Hg, selected from a dithia-dioxa-monoaza crown ether compound, an N,N-di(hydroxyethyl)amine, an N,N-di(carboxyethyl)amine, and mixtures of two at least of these compounds, is bonded to said semiconductor material or to an electrode of said electrical device. The invention finds application in the field of the detection of mercuric ions, in particular.


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