The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2012

Filed:

Apr. 21, 2010
Applicants:

Hideki Tanaka, Tama, JP;

Jun Hasegawa, Hino, JP;

Toshio Nakamura, Hachioji, JP;

Inventors:

Hideki Tanaka, Tama, JP;

Jun Hasegawa, Hino, JP;

Toshio Nakamura, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endoscope bending control apparatus includes: an image feature value calculating section for calculating, based on an endoscopic image, an image feature value related to a luminal dark part; a bending control section for performing bending control on a bending portion in either one of a first bending operation mode in which a position of the luminal dark part is set as an insertion target and a distal end of the insertion portion is directed to the position and a second bending operation mode in which the distal end of the insertion portion is directed in a direction of the position of the luminal dark part; an operation mode switching section for switching an operation mode from one bending operation mode to the other according to a first switching condition based on the calculated image feature value; and a switching condition changing section for changing the first switching condition.


Find Patent Forward Citations

Loading…