The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2012

Filed:

Nov. 08, 2005
Applicants:

Yoshio Frank Turner, Redwood City, CA (US);

Aravind Menon, Lausanne, CH;

Jose Renato Santos, San Jose, CA (US);

Gopalakrishnan Janakiraman, Sunnyvale, CA (US);

Inventors:

Yoshio Frank Turner, Redwood City, CA (US);

Aravind Menon, Lausanne, CH;

Jose Renato Santos, San Jose, CA (US);

Gopalakrishnan Janakiraman, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 9/46 (2006.01); G06F 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to an embodiment, a method of sampling hardware events in a computer system comprises a first step and iterative performance of second and third steps. In the first step, an initiator virtual machine identifies a profiling event and a count to a virtual machine monitor. The virtual machine monitor iteratively performs the second and third steps. In the second step, the virtual machine monitor programs a hardware event counter with the count for the profiling event. In the third step, upon receiving an interrupt from the hardware event counter, the virtual machine monitor saves a sample that comprises a code-in-execution identifier.


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