The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Dec. 22, 2008
Jeff S. Brown, Fort Collins, CO (US);
Mark F. Turner, Longmont, CO (US);
Jonathan Byrn, Fort Collins, CO (US);
Jeff S. Brown, Fort Collins, CO (US);
Mark F. Turner, Longmont, CO (US);
Jonathan Byrn, Fort Collins, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A sequential element having a master stage and a slave stage and a method of testing an IC having a scan chain and an IC. In one embodiment, the sequential element includes an input scan multiplexor configured to place the sequential element in a functional mode or a scan mode in response to a scan enable input and a scan out driver coupled to the slave stage and configured to provide a scan out signal when the sequential element is in the scan mode, the scan out driver coupled to an inverted scan enable input for a negative voltage supply.