The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Jun. 08, 2009
James E. Sylvester, McLean, VA (US);
Alexander Laparidis, Mansfield, MA (US);
Stanley Y. Lee, Framingham, MA (US);
Muzaffer Kanaan, Watertown, MA (US);
James E. Sylvester, McLean, VA (US);
Alexander Laparidis, Mansfield, MA (US);
Stanley Y. Lee, Framingham, MA (US);
Muzaffer Kanaan, Watertown, MA (US);
Verizon Services Corp., Ashburn, VA (US);
Verizon Services Organization Inc., Irving, TX (US);
Abstract
A test set for evaluating network performance is described, and which may include an output device, a processor, a power supply, a memory unit, and a control terminal. The test set may be configured to receive a user-entered selection of one of a plurality of different bit-error rate profiles and generate a test signal exhibiting the selected bit-error rate profile. The test set may also supply the test signal exhibiting the selected bit-error rate profile to a network under test. In addition, the test set may receive as an input, an output from the network under test. The output may include the test signal exhibiting the selected bit-error rate. The test set may evaluate the received test signal and determine the performance of the network in response to the received test signal exhibiting the bit-error rate. The test set may then output the results of the evaluation.