The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Jul. 09, 2008
Giovanni Guido Maria Bavestrelli, Milan, IT;
Giovanni Boselli, Milan, IT;
Andrea Tognoni, Milan, IT;
Claudio Trevisan, Cardano Al Campo, IT;
William Hill, Dundas, CA;
Paul Schumacher, Hamilton, CA;
Giovanni Guido Maria Bavestrelli, Milan, IT;
Giovanni Boselli, Milan, IT;
Andrea Tognoni, Milan, IT;
Claudio Trevisan, Cardano Al Campo, IT;
William Hill, Dundas, CA;
Paul Schumacher, Hamilton, CA;
Tenova S.p.A., Milan, IT;
Abstract
A method for classification of defects and running of grinding of lamination cylinders includes identifying defect areas in a map illustrating a plurality of surface measurements of a cylinder. The method includes calculating, for each area identified, a plurality of parameters. The method includes identifying a type of defect associated with the areas identified, on the basis of the parameters calculated. The method includes determining an acceptability threshold of a specific defect for each type of defect identified. The method includes defining a corrective action for each area on the basis of a comparison between the acceptability threshold associated with the type of defect of the area, and a measurement of the surface measurements of the cylinder associated with the area. The method includes determining grinding parameters on the basis of the surface measurements of the cylinder, if the corrective action is a grinding operation to remove the defects.