The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Apr. 24, 2008
Samir Sheth, Plano, TX (US);
Andy James Filtness, Frisco, TX (US);
Samir Sheth, Plano, TX (US);
Andy James Filtness, Frisco, TX (US);
IPhotonixs, LLC, Jersey City, NJ (US);
Abstract
An optical transceiver calibration system and manufacturing method to fabricate a dual closed loop control transceiver are provided. The calibration system and method includes measuring an operating temperature and determining operational parameters based upon the operating temperature. The operational parameters may include, for example, a target power for transmitting a digital one, a target power for transmitting a digital zero, a modulation current, and a bias current. A bias may be added to the temperature to account for the difference between the temperature at the temperature sensor and the optical equipment. The operational parameters are preferably calculated independently of each other and are used as initial values during operating modes and allow the control loop to converge more quickly. The optics data is may be scanned electronically via bar code or some other electronic format prior to test. The software residing on the module then calibrates and configures the transceiver.